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吴秀梅副教授简历

吴秀梅:女,博士,副教授,硕士生导师。

Appl.Phys.Lett.等国际核心期刊共发表学术论文30篇,申请发明专利3项。全文被Phys.Rev.Lett.Materials TodayApplied Phys.Lett.等著名SCI期刊引用近120次,其中他引近80次。

 

联系方式:江苏省南京市江宁区东南大学物理系

                  田家炳南楼309

                  邮编:211189

                  电话:025-52090600-6309

                  Email: xiumeiwu@seu.edu.cn

 

主要研究领域薄膜物理学,铁磁薄膜的外场效应,低维材料的可控生长

 

主要研究经历

20125-至今,东南大学物理系,副教授

20076-20124月,东南大学物理系,讲师

20029-20075月,南京大学固体微结构物理国家重点实验室,博士

19989-20029月,河南师范大学,物理与电子工程学院,学士

 

主持的科研项目:

1.Fe3O4/BaTiO3磁电复合薄膜的应力效应研究”,国家自然科学基金青年科学基金项目, 2012/1-2014/12, 主持

2.Bi3.25La0.75Ti3O12铁电薄膜应力效应的理论研究” 国家自然科学基金 理论物理专项,(2011.01-2011.12),主持

3.BaTiO3-CoFe2O4磁电复合薄膜材料应力效应的研究”南京大学固体微结构物理国家重点实验室开放课题,(2011.04-2013.03),支持

4.应力对多铁性薄膜性能影响的研究 ,南京大学固体微结构物理国家重点实验室开放课题,(2009.04-2011.03),主持

5.“应力与温度效应协同作用对Bi3.25La0.75Ti3O12铁电薄膜材料性能影响的研究”,

东南大学创新基金,(2011.01-2012.12)主持

6.多铁性 磁电材料性能及应力效应的研究”,东南大学预研基金,

2010.07-2011.07主持

 

已发表部分论文及申请专利:

[30] Wu XM, Zhai Y, Xu MX and Kan Y, Annealing temperature and ultraviolet irradiation effect on the ferroelectric properties of Bi3.25La0.75Ti3O12 thin films,J. Nanosci. Nanotechnol. 126567 2012

[29] Wu XM, Zhai Y, Xu MX and Kan Y; “Effects of ultraviolet irradiation and soak time on the leakage current of Bi3.25La0.75Ti3O12 thin films”, Phys. Status Solidi C 9, 1, 85–88 (2012)

[28] 吴秀梅翟亚戴玉蓉陈华对薄膜提供外加原位应力的装置及其对应力值的测量方法发明专利申请号201210402449.1申请日20121019

[27] 吴秀梅,翟亚,孙弘扬,欧慧灵,四氧化三铁与钛酸铋掺镧复合磁电薄膜的制备方法,发明专利,申请号:201210532448.9,申请日:20121211

[26] Wu XM,, Dong S, Zhai Y, Xu MX, Kan Y, Testing field and annealing temperature dependence of leakage properties in Bi3.25La0.75Ti3O12 thin films”,Thin Solid Films, 519, 2376 (2011).

[25] Wu XM, Chen H, Zhai Y, Lu XM, Liu YF, and Zhu JS,”Effects of switching pulse width and stress on properties of Bi3.25La0.75Ti3O12 thin films”,Chin. Phys. B. 19, 036802 (2010).

[24] Wu XM, Kan Y, Lu XM, Zhu JS, and Zhai Y,”Annealing temperature effect on internal strain and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films”,Ferroelectrics, 400, 263 (2010).

[23] Chen H, Wu XM, Yang WX, Modulated Terahertz Transmission through Sub-Wavelength Cu Grating by Liquid Water”,Chin. Phys. Lett. 27, 010701 (2010).

[22] Liu YF, Kan Y, Lu XM, Cai W, Wu XB, Wu XM, Wang XF, Bo HF, Huang FZ, Zhu JS

Stress impact on dielectric properties of Bi3.15Nd0.85Ti3O12 films”,Appl. Phys. Lett. 96, 072902 (2010).

[21] Wu XM, Zhai Y, Kan Y, Lu XM, Zhu JS,“Mechanical stress induced voltage shift in polycrystalline Bi3.25La0.75Ti3O12 thin films”,J. Appl. Phys. 106, 084105 (2009).

[20] Wu XM, Lu XM,, Liu YF, Huang FZ, Zhu JS,“Stress and its related effects on the fatigue behavior of Bi3.25La0.75Ti3O12 thin films”,Solid State Commun. 149, 205 (2009).

[19] Kan Y, Liu YF, Mieth O, Bo HF, Wu XM, Lu XM, Eng LM. and Zhu JS,“Mechanical stress induced polarization reorientation in polycrystalline Bi3.25La0.75Ti3O12 films”,Phys. Lett. A 374, 360 (2009).

[18] Huang FZ, Lu XM, Wang Z, Xu S, Wu XM, Zhu JS,“Improved electric properties of Nd-doped BiFeO3 thin films prepared by metal organic decomposition method”,Integr. Ferroelectr. 96, 112 (2008).

[17] Lu ZL, Mo ZR,  Zou WQ, Wang S, Yan GQ, Liu XC, Lin YB, Xu JP, Lv LY, Wu XM, Xia ZH, Xu MX, Zhang FM, Du YW,“Room-temperature ferromagnetism in p-type (Mn, N)-codoped ZnO thin films achieved by thermal oxidation of sputtered Zn3N2 Mn films”,

J. Phys. D: Appl. Phys. 41, 115008 (2008).

[16] Li LB, Lu XM, Chen QD, Wu XM, Zhu JS,“Thermodynamic analysis of stress effect on Bi4Ti3O12filmsJ. Appl Phys. 103, 034112 (2008).

[15] Huang FZ, Lu XM, Lin WW, Cai W, Wu XM, Kan Y, Sang H, Zhu JS,“Multiferroic properties and dielectric relaxation of BiFeO3/ Bi3.25La0.75Ti3O12 double-layered thin films”,Appl. Phys. Lett. 90, 252903 (2007).

[14] Wu XM, Lu XM, Kan Y, Huang FZ, Ma J, and Zhu JS,“Coeffect of size and stress in Bi3.25La0.75Ti3O12 thin films”,Appl. Phys. Lett. 89, 122910 (2006).

[13] Wu XM, Huang FZ, Lu XM, Wang X, Kan Y, Ma J, Cai W, Zhu JS,“Field-dependent ferroelectric properties of BLT thin films under different stress”,Integr. Ferroelectr. 85, 175 (2006).

[12] Wu XM, Lu XM, Guo Y, Wu XS, Cai HL, Zhu JSStress effect on Bi3.25La0.75Ti3O12 thin films”Integr. Ferroelectr. 79, 47 (2006).

[11] 吴秀梅,吕笑梅,朱劲松,“应力对铋系铁电薄膜性能影响研究的进展”,物理学进展 26, 490 (2006).

[10] Huang FZ, Lu XM, Lin WW, Wu XM, Kan Y, and Zhu JS,“Effect of Nd dopant on magnetic and electric properties of BiFeO3 thin films prepared by metal organic deposition method’,Appl. Phys. Lett. 89, 242914 (2006).

[9] Wang Y, Zhu C, Wu XM, Liu JM,”Temperature-dependent fatigue behaviors of ferroelectric Bi4-xLaxTi3O12 thin films”,Integr. Ferroelectr. 79, 37 (2006).

[8] Kan Y, Lu XM, Wu XM and Jinsong Zhu,“Domain reversal and relaxation in LiNbO3 single crystals studied by piezoresponse force microscope”,Appl. Phys. Lett. 89, 262907 (2006).

[7] Wu XM, Lu XM, Chen AP, Yin Y, Ma J, Li W, Kan Y, Qian D, and Zhu JS,“Stress effects on ferroelectric and fatigue properties of Nd- and La-doped Bi4Ti3O12 thin films”,Appl. Phys. Lett. 86, 092904 (2005).

[6] Lu XM, Wu XM, Li LB, Qian D, Li W, Ye YD, Wu XS, Zhu JS,“Switching properties of Nd- and La-doped Bi4Ti3O12 thin films under applied stress”,Phys. Rev. B. 72, 212103 (2005).

[5] Li LB, Wu XM, Lu XM, Zhu JS,“Effect of external mechanical stress on the domain structure of Pb(Zr0.35Ti0.65)O3 thin films”,Solid State Commun. 135, 703 (2005).

[4] Gu J, Su D, Wu XM, Song CH, Li W, Lu XM, Zhu JS,“Structural and ferroelectric properties of yttrium substituted bismuth titanium thin films”,Thin Solid Films 492, 264 (2005).

[3] 朱劲松,吕笑梅,杨震,吴秀梅,“薄膜电学性能测量中提供外加原位应力的装置及使用方法”,创新性发明专利,专利号:200410041050.0 (2004. 06. 22)中国

[2] Ma J, Lou J, Su D, Wu XM, Song CH, Lu XM, Zhu JS,“Structural and ferroelectric properties of Bi4-xYxTi3O12 films”,Integr. Ferroelectr. 65, 105 (2004).

[1] Wu XM,, Li W, Ma J, Qian D, Lu XM, Zhu JS,“Stress impact in Nd doped Bi4Ti3O12 thin films”,Integr. Ferroelectr. 65, 13 (2004).

 

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